ipTEST have concluded the development of the DS5 short circuit apps adapter that enables us to perform high speed stress tests on the new generation of semiconductor devices, adapting conventional component handling equipment previously considered inadequate for such testing, thereby providing greater productivity at lower cost. For more information please see our M2 webpage.
M2 DS5 generator
ipTESt are delighted to announce a new M2 product development for performing dynamic tests on all types of semiconductor devices. The DS5 improves on the performance of the DS4 product in terms of measurement accuracy and throughput. It also reduces the footprint of the system and allows the test head to be brought in close proximity to the handler units.
