Unclamped Inductive Switching (UIS) Tester

The high-speed unclamped inductive switching (UIS) generator is specifically designed for fast production testing of avalanche energy rating for power discrete devices.

Designed to test the wide avalanche operation area of the latest generation of discrete Mosfet devices, our UIS generator provides programmable current source capability from 1A to 200A for avalanche voltages from 10V to 2300V, with internally programmed inductor values from 12.5H to 25.5mH.

Dual channel waveform capture with 12bit, 25ns resolution fully characterises the device in under 200ms, with an additional fast GO/NO-GO production test mode.

A new energy-cut-off mode terminates the avalanche test when the programmed avalanche energy is reached.

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UIS test head

The compact remote test head includes measurement functions and a switched output to allow testing on various 3-pin package types including dual diode configurations. Provision of a performance board in the test head allows custom application specific test conditions to be programmed.

ipTEST system architecture allows for up to eight independent test generators to be accommodated in a single system. These can be grouped and assigned to handlers or probers through up to four control interfaces. Each test generator is a self-contained application-specific tester that includes a dual microcontroller (for test plan storage and execution), 16-bit A-D converter, quad D-A converters and automatic self check.

UIS tests

  • Programmable current from 1A to 200A

  • Programmable load inductors 12.5H to 25.5mH

  • Avalanche voltage from 10V to 2300V

  • Repetitive Avalanche energy from 300mJ to 30J

  • Current and Voltage 12bit waveform capture to 25ns resolution

  • Over current and over voltage protection

  • Fast Go/No-Go test

  • Energy cut-off mode