MOSTRAK index parallel tester
The ipTEST indexed parallel architecture was developed specifically to provide the fastest possible solution for packaged device testing. The idea of partitioning the test programme, and performing the tests on multiple in-line test heads was not new when ip architecture was conceived. It was however the first, and remains the only single platform, fully integral tester, with all the test functions under one central controller, and just one test programme. This is a true "one-stop shop" tester.
ipTEST's MOSTRAK tester is an Indexed-parallel parametric test system designed to test discrete devices. MOSTRAK can test static, thermal, avalanche and dynamic parameters on MOSFETs, Bipolars, IGBT's, Diodes, Zeners, SCR's, triacs as well as linear voltage regulators and TVS devices.
A typical system configuration is given below which consists of LV + HV generators combined into a single test site, dynamic switching, thermal and Rg generators. Separate HV/LV generators are also included for independent QA testing (100% or AQL). All the generators would be included in a single High-Line cabinet with a footprint of 0.7m x 1.1m, with test heads placed close to the handler system attached to the cabinet with 5m cables. A Highline cabinet is required when either high power (above 100 amps) and multiple LV or HV are included. Alternatively, up to four test generator modules can be housed in a Low-line cabinet.
The test system controller is an industrial PC running our tester software on the Linux operating System. The computer interfaces to your factory network using SEMI standard STDF data format.
MOSTRAK is a complete tester for all discrete components, including diodes, zeners, SCR's, triacs, bipolar transistors, and IGBTs. But it doesn't stop there. We recognise that where production line investment is in a particular package style, it is economically desirable to test all products in that particular package
MOSTRAK Index-parallel architecture means that specific generators are allocated to specific sites on a handler. This allows the handler to run at its fastest possible speed, so typically one can test Dpak and TO220 devices at 12000 - 14000 units per hour on a rotary handler. Around 80% of MOSTRAK systems go into back-end packed device testing.
Test Generators
Generally, individual generators reside within the tester cabinet and are connected to the Device Under Test (DUT) via cables to Loadboxes situated close to the handler contacts. The Loadboxes may additionally have instrumentation to make sensitive or high-speed measurements, e.g. the UIS generator locates the current measure transformer in the Loadbox.
Brief specifications of each generator are listed below.
1. LV generator (on-state tests such as RDSon, Id)
· 100A, 200A, 400A and 1000A variants
· Kelvin test
· Basic 1% accuracy
· 1mohm-RDSon capable
2. HV generator (Reverse-bias static tests such as BVDss, IDss)
· 2KV, 8KV and 10KV variants
· Kelvin test
· Basic 1% accuracy
· 100nA low-current measure range
3. Thermal (forward-biased SOA tests such as RthJC)
· 30A and 100V/ up to 100A and 300V, 10kJ
· Up to 10second test time
· Supports basic LV static tests
4. Unclamped Inductive Switching (Avalanche tests such as EAS)
· Maximum 2.2KV and 200A
· Programmable load inductors 12.5uH to 25mH
· Built-in waveform capture
5. Dynamic Switching testing (e.g. Trr)
· Four independent power sources up to 1.5KV
· Resistive or programmable inductive loads (100uH to 1mH)
· Gate charge test (MOSFETs & IGBTs)
· Integrated Waveform capture via high-speed oscilloscope
· 200A Short-circuit test
6. Rg (MOSFET & IGBT Gate resistance)
· 1MHz DSP processor
· 1pF to 20nF measure range
· Programmable drain bias (+/-30V) and gate bias (+/-10v)
· Kelvin test