DOWNLOADS
Below are links to files available to download.
The latest tester software, manuals and other files can be found at our customer portal. Please contact us at support@iptest.com for details and access to the portal.
ipTEST Product Information
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DC Static Test Measurements for MOSFET, GaN & SIC
Speed is everything in a production environment. This document describes how the ipTEST M2 HVLV test generator can enable you to achieve new standards in UPH.
Our systems test all discrete power devices including, MOSFETs, IGBTs, Bipolar, Diodes, SCRs and TRIACs, as well as newer highspeed, low-loss, wide-bandgap devices using SiC and GaN. Click on the image to learn more.
Dynamic Switching Measurements for MOSFET, GaN & SIC
SiC and GaN devices are revolutionising power electronics due to their faster switching times and lower energy losses.
The DS5 Dynamic Switch Generator has been built with the lowest parasitics to test the most demanding devices in production environments. Learn more about the DS5 by clicking the image here.
UIS Avalanche Testing for MOSFET, GaN & SIC
Today’s high speed devices lead to higher stresses than were encountered in slower, previous generation devices.
The ipTEST Unclamped Inductive Switching (UIS) test generator is able to perform UIS tests to confirm the ability of MOSFET devices to withstand avalanche events. An energy cut-off mode terminates the avalanche test when the programmed avalanche energy is reached. Click on the image to learn more.
Measuring Gate Resistance & Capacitance
Faults in the processing of the gate region on a Power MOSFET may cause increased gate resistance leading to device failures in the field.
The ipTEST Rg test generator performs an AC test to measure the gate resistance and capacitance of MOSFET and IGBT devices. Click on the image to learn more.